Spectroscopic infrared near-field nanoscopy for mapping chemical composition, electronic conduction and plasmonic fields
Dr. Fritz Keilmann (LMU München, Soft Condensed Matter Group)
While the sharp tip of a scanning probe microscope (e.g. AFM) allows to map a specimen's surface relief (topography), the additional illumination of this tip enables a simultaneous optical mapping; luckily, the optical image results at the same high AFM spatial resolution of typically 20 nm. The tremendous enhancement over classical (diffraction-limited) light microscopy is especially striking for long-wavelength infrared and THz radiation. The talk will introduce the underlying concept of near fields and highlight results in solid-state physics, biomineralization, and graphene plasmonics.